Jacob Abraham and Students Receive Best Paper Award
Jacob Abraham receives the Best Paper Award at the 24th Institute of Electrical and Electronics Engineers’ (IEEE) Very-Large Scale Integration (VLSI) Test Symposium (VTS). The paper “Spectral Prediction for Specification-Based Loopback Test of Embedded Mixed-Signal Circuits,” written by Abraham and graduate students Hongjoong Shin and Byoungho Kim, discusses problem-solving methods for testing mixed-signal circuits.